G. Baskaran

Ultrasonic TOFD flaw sizing and imaging in thin plates using embedded signal identification technique (ESIT)

Krishnan Balasubramaniam, C. Lakshmana Rao, C. V. Krishnamurthy, 2004 .

Shear-wave time of flight diffraction (S-TOFD) technique

Krishnan Balasubramaniam, C. Lakshmana Rao, G. Baskaran, 2006 .

Inspection Using Shear Wave Time of Flight Diffraction (S‐TOFD) Technique

Krishnan Balasubramaniam, C. V. Krishnamurthy, G. Baskaran, 2006 .