T. Kamiya

Temperature dependence of single-event transient current induced by heavy-ion microbeam on p/sup +//n/n/sup +/ epilayer junctions

J.S. Laird, S. Onoda, T. Wakasa, 2003, Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003..

EFFECTIVENESS OF A COMBINATION OF ML-EM AND STIM-CT IN PIXE-CT FOR BIOLOGICAL SPECIMEN

Naofumi Kozai, Wataru Kada, Akihito Yokoyama, 2012 .

Comprehensive study on layout dependence of soft errors in CMOS latch circuits and its scaling trend for 65 nm technology node and beyond

T. Noguchi, F. Matsuoka, H. Yoshimura, 2005, Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..