D. M. Tanner

Science-based MEMS reliability methodology

D. M. Tanner, T. B. Parson, A. D. Corwin, 2007, Microelectron. Reliab..

Self-stressing structures for wafer-level oxide breakdown to 200 MHz

D. M. Tanner, E. S. Snyder, M. R. Bowles, 1994, Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS).

The Dependence Of Ramp Rate On Breakdown Voltage And The Relation Of Breakdown Charge Density To Breakdown Field For Voltage Ramp Testing Of Oxides For Various Companies

D. M. Tanner, C. Messick, 1993, International Integrated Reliability Workshop Final Report.

MEMS reliability: Where are we now?

D. M. Tanner, D. Tanner, 2009, Microelectron. Reliab..

Electrical and chemical characterization of FIB-deposited insulators

D. M. Tanner, Diane K. Stewart, Ann N. Campbell, 1997 .

Resonant frequency method for monitoring MEMS fabrication

D. M. Tanner, Danelle M. Tanner, A. C. Owen, 2003, SPIE MOEMS-MEMS.

Frequency dependence of the lifetime of a surface micromachined microengine driving a load

D. M. Tanner, Kenneth A. Peterson, Paiboon Tangyunyong, 1999 .

Origin of the structures in the 12 C( 16 O,α) reaction: Dominance of 20 Ne * and 16 O * sequential α-decay processes

D. M. Tanner, Y. Lui, N. Takahashi, 1984 .

The effect of humidity on the reliability of a surface micromachined microengine

D. M. Tanner, Jeremy A. Walraven, Danelle M. Tanner, 1999, 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296).

The effect of frequency on the lifetime of a surface micromachined microengine driving a load

D. M. Tanner, Kenneth A. Peterson, Paiboon Tangyunyong, 1998, 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173).

Wear Mechanisms in a Reliability Methodology

D. M. Tanner, Danelle M. Tanner, Michael Thomas Dugger, 2003, SPIE MOEMS-MEMS.