Xiaohui Li

Unipolar recovery of dielectric breakdown in fully silicided high-κ gate stack devices and its reliability implications

Nagarajan Raghavan, Kin Leong Pey, X. Wu, 2010 .

Triboelectrification induced UV emission from plasmon discharge

Zhong Lin Wang, Zhou Li, C. Han, 2014, Nano Research.

Detection of high-κ and interfacial layer breakdown using the tunneling mechanism in a dual layer dielectric stack

Nagarajan Raghavan, Kin Leong Pey, K. Pey, 2009 .

Thermal stability of TiN metal gate prepared by atomic layer deposition or physical vapor deposition on HfO2 high-K dielectric

Kin Leong Pey, Hun-Jan Tao, Da-Yuan Lee, 2010 .

Triboelectric filtering for air purification

Tao Jiang, Zhong Lin Wang, Tao Jiang, 2019, Nanotechnology.

Chemical insight into origin of forming-free resistive random-access memory devices

Guo-Qiang Lo, Nagarajan Raghavan, Michel Bosman, 2011 .