S. Takagi
发表
H. Ohno,
H. Koinuma,
A. Ohtomo,
2004
.
H. Ohno,
S. Takagi,
Tokyo Institute of Technology,
2003
.
Tokyo Institute of Technology,
Yokohama,
H. Ohno,
2003,
cond-mat/0308537.
J. Welser,
S. Takagi,
J. Hoyt,
1994,
Proceedings of 1994 IEEE International Electron Devices Meeting.
Masashi Kawasaki,
Akira Ohtomo,
Hideo Ohno,
2003
.
Back gate engineering for suppression of threshold voltage fluctuation in fully-depleted SOI MOSFETs
T. Numata,
Y. Oowaki,
M. Noguchi,
2000,
2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125).
Shinichi Takagi,
A. Toriumi,
H. Satake,
1997,
1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual.
Shinichi Takagi,
Y. Toyoshima,
S. Takagi,
2001,
2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167).
Shinichi Takagi,
Akira Toriumi,
S. Takagi,
1988,
Technical Digest., International Electron Devices Meeting.
Masashi Kawasaki,
Akira Ohtomo,
Hideomi Koinuma,
2006
.
Shinichi Takagi,
Akira Toriumi,
Junji Koga,
1994,
Proceedings of 1994 IEEE International Electron Devices Meeting.