Ching-Chieh Shih

Dynamic Bias Instability of p-Channel Polycrystalline-Silicon Thin-Film Transistors Induced by Impact Ionization

Cheewee Liu, Yen‐Ting Chen, Ying-Jhe Yang, 2009, IEEE Electron Device Letters.

A Current Estimation Method for Bias-Temperature Stress of a-Si TFT Device

K. Fang, F. Gan, Ching-Chieh Shih, 2007, IEEE Transactions on Device and Materials Reliability.

Electrical Properties of Metal–Silicon Nitride–Hydrogenated Amorphous Silicon Capacitor Elucidated Using Admittance Spectroscopy

M. Hsieh, Jenn‐Fang Chen, H. Zan, 2008 .

P‐61: Temperature Coefficient of Diode‐Connected LTPS Poly‐Si TFTs and its Application on the Bandgap Reference Circuit

M. Ker, Chun-Ting Liu, H. Zan, 2008 .

15.4: Excellent Performance of Indium‐Oxide‐Based Thin‐Film Transistors by DC Sputtering

C. X. Qiu, Ishiang Shih, Yi-Chi Shih, 2009 .