Dong-Ho Nam

Performance and Stability Characterization of Bottom Gated Amorphous Indium Gallium Zinc Oxide Thin Film Transistors Grown by RF and DC Sputtering

Dong-Ho Nam, Ga-Won Lee, Won-Ho Choi, 2009 .

Extraction of Energy Distribution of Nitride Traps Using Charge Pumping Method in Silicon–Oxide–Nitride–Oxide–Silicon Flash Memory

H. Lee, Ga-Won Lee, Seaung-Suk Lee, 2009 .

Overcoming the reliability limitation in the ultimately scaled DRAM using silicon migration technique by hydrogen annealing

Sungjoo Hong, Seong-Wan Ryu, T. Jang, 2017, 2017 IEEE International Electron Devices Meeting (IEDM).

Instability dependent upon bias and temperature stress in amorphous‐indium gallium zinc oxide (a‐IGZO) thin‐film transistors

Ga-Won Lee, Jae Kyeong Jeong, Kwang Il Choi, 2010 .

Source/Drain Overlap Length Dependence of VT in Thin Film Transistor on a-IGZO Channel Deposited by RF and DC Sputtering

Jae Kyeong Jeong, Ga-Won Lee, S. Park, 2008 .