M. C. Wang

Influence of mechanical bending and temperature on the threshold voltage instability of a-Si:H thin-film transistors under electrical stress

Ting‐Chang Chang, Yi Shi, Shih-Ching Chen, 2011 .

The instability of a-Si : H TFT under mechanical strain with high frequency ac bias stress

Po-Tsun Liu, Ting‐Chang Chang, Po-Tsun Liu, 2007 .

Improvement of n+-doped-layer free amorphous silicon thin film solar cells fabricated with CuMg alloy as back contact metal

Ting‐Chang Chang, Y. Chen, C. Ai, 2012 .

Low-temperature characteristics of a-Si:H thin-film transistor under mechanical strain

Tzong-Sheng Chang, Ting‐Chang Chang, Yi Shi, 2010 .

Temperature influence on photo-leakage-current characteristics of a-Si:H thin-film transistor

Ting‐Chang Chang, Yi Shi, S. Chen, 2010 .

Schottky Barrier Height for the Photo Leakage Current Transformation of a‐Si : H TFTs

Ting‐Chang Chang, Po-Tsun Liu, L. F. Lin, 2007 .

Mechanical bending effect on the photo leakage currents characteristic of amorphous silicon thin film transistors

Ting‐Chang Chang, Po-Tsun Liu, S. Tsao, 2010 .

Time dependent dielectric breakdown (TDDB) characteristics of metal-oxide-semiconductor capacitors with HfLaO and HfZrLaO ultra-thin gate dielectrics

H. W. Chen, C. H. Liu, H. Hsu, 2011, The 4th IEEE International NanoElectronics Conference.