H. Toutah

Stability of polysilicon thin film transistors under switch operating

O. Bonnaud, T. Mohammed-Brahim, J. Llibre, 2000 .

Ageing of laser crystallized and unhydrogenated polysilicon thin film transistors

C. Prat, H. Toutah, B. Tala-Ighil, 1999 .

State creation under gate-bias stress in polysilicon TFTs studied from the temperature-transfer characteristics behavior

B. Boudart, T. Mohammed-Brahim, J. Llibre, 2003 .

Degradation in polysilicon thin film transistors related to the quality of the polysilicon material

Olivier Bonnaud, Jean-François Llibre, Taieb Mohammed-Brahim, 2003, Microelectron. Reliab..