Qi Shan

Dynamic degradation of a-InGaZnO thin-film transistors under pulsed gate voltage stress

Mingxiang Wang, Qi Shan, Mingxiang Wang, 2015 .

A Unified Degradation Model of a-InGaZnO TFTs Under Negative Gate Bias With or Without an Illumination

Mingxiang Wang, Huaisheng Wang, Dongli Zhang, 2019, IEEE Journal of the Electron Devices Society.

Roles of Gate Voltage and Stress Power in Self-Heating Degradation of a-InGaZnO Thin-Film Transistors

Mingxiang Wang, Huaisheng Wang, Dongli Zhang, 2021, IEEE Transactions on Electron Devices.

Mechanical Reliability of Flexible a-InGaZnO TFTs under Dynamic Stretch Stress

Mingxiang Wang, Huaisheng Wang, Dongli Zhang, 2018, IEEE Transactions on Electron Devices.

A unified model to understand degradation of a-InGaZnO TFTs under various gate bias stresses with or without light illumination

Mingxiang Wang, Huaisheng Wang, Qi Shan, 2015, 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Investigation of instabilities of a-IGZO TFTs under illumination and gate bias stress

Mingxiang Wang, Dongli Zhang, Qi Shan, 2014, 2014 IEEE International Conference on Electron Devices and Solid-State Circuits.