Do-Hyung Kim

Interface State Control of Amorphous InGaZnO Thin Film Transistor by Surface Treatment of Gate Insulator

Sang Yeol Lee, Bosul Kim, Do-Hyung Kim, 2011 .

The Effects of UBM and SnAgCu Solder on Drop Impact Reliability of Wafer Level Package

H. Ahn, Sungdong Kim, Do-Hyung Kim, 2010 .

Study on the Electrical Properties of Amorphous HfInZnO TFTs Depending on Sputtering Power

B. Ju, Donghyeon Yoo, E. Chong, 2011 .

Modeling of cumulative thermo-mechanical stress (CTMS) produced by the shallow trench isolation process for 1 Gb DRAM and beyond

T. Park, J. Kong, Jae-Kwan Park, 1998 .