R. Glang

Defect size distribution in VLSI chips

R. Glang, 1991 .

Boron diffusion in silicon at high concentrations

R. F. Lever, F. Morehead, R. Glang, 1988 .

Resistivity and Structure of Cr–SiO Cermet Films

R. Glang, R. A. Holmwood, S. Herd, 1967 .

Determination of Stress in Films on Single Crystalline Silicon Substrates

R. L. Rosenfeld, R. Glang, R. A. Holmwood, 1965 .

Defect size distribution in VLSI chips

R. Glang, R. Glang, 1990, International Conference on Microelectronic Test Structures.