Zungsun Choi

Correlation of stress and structural evolution in Li4Ti5O12-based electrodes for lithium ion batteries

Reiner Mönig, D. Kramer, R. Mönig, 2013 .

Effect of pre-existing void in sub-30nm Cu interconnect reliability

Joo-Tae Moon, J. Moon, Siyoung Choi, 2010, 2010 IEEE International Reliability Physics Symposium.