B. Park

Amorphous silicon detector and thin film transistor technology for large area imaging of X-rays

Arokia Nathan, Andrei Sazonov, R.V.R. Murthy, 2000 .

Extraction of critical dimension reference feature CDs from new test structure using HRTEM imaging

A. Hunt, B. Park, R.A. Allen, 2005, Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005..