S. Krishnan

Energy driven modeling of OFF-state and sub-threshold degradation in scaled NMOS transistors

D. Varghese, V. Reddy, M. Nandakumar, 2014, 2014 IEEE International Reliability Physics Symposium.

A new look at the antenna effect

S. Krishnan, Douglas P. Verret, A. Krishnan, 2002 .

A Quantitative Assessment of Charge Collection Efficiency of N+ and P+ Diffusion Areas in Terrestrial Neutron Environment

R. Baumann, Xiaowei Zhu, S. Krishnan, 2007, IEEE Transactions on Nuclear Science.

Impact of transistor reliability on RF oscillator phase noise degradation

N. Barton, V. Reddy, A. Krishnan, 2009, 2009 IEEE International Electron Devices Meeting (IEDM).

off-State Degradation in Drain-Extended NMOS Transistors: Interface Damage and Correlation to Dielectric Breakdown

H. Shichijo, H. Kufluoglu, D. Varghese, 2007, IEEE Transactions on Electron Devices.

Impact of gate area on plasma charging damage: the "reverse" antenna effect

A.T. Krishnan, P. Nicollian, S. Krishnan, 2002, Digest. International Electron Devices Meeting,.