Gabriel Nagy

New OBIST Using On-Chip Compensation of Process Variations Toward Increasing Fault Detectability in Analog ICs

Viera Stopjakova, Daniel Arbet, Gabor Gyepes, 2013, IEEE Transactions on Nanotechnology.

Novel CMOS Bulk-driven Charge Pump for Ultra Low Input Voltage

Viera Stopjakova, Daniel Arbet, Martin Kovac, 2016 .