D. A. Smith

Submicron resolution measurement of stress in silicon by near-field Raman spectroscopy

David N. Batchelder, S. Webster, D. Batchelder, 1998 .

Raman microscopy using a scanning near-field optical probe

David N. Batchelder, S. Webster, D. A. Smith, 1998 .

Chemical force microscopy: applications in surface characterisation of natural hydroxyapatite

Jennifer Kirkham, J. Kirkham, C. Robinson, 2003 .

Simple Chemical Method for Forming Silver Surfaces with Controlled Grain Sizes for Surface Plasmon Experiments

David N. Batchelder, Yuika Saito, Y. Saito, 2003 .