Sungbae Hwang

Design for testability features of the SUN microsystems niagara2 CMP/CMT SPARC chip

Hong Kim, Thomas A. Ziaja, Robert F. Molyneaux, 2007, 2007 IEEE International Test Conference.

Optimal BIST using an embedded microprocessor

Jacob A. Abraham, Sungbae Hwang, 2002, Proceedings. International Test Conference.

Test data compression and test time reduction using an embedded microprocessor

Jacob A. Abraham, Sungbae Hwang, 2003, IEEE Trans. Very Large Scale Integr. Syst..

Efficient loop-back testing of on-chip ADCs and DACs

Jeongjin Roh, Jacob A. Abraham, Sungbae Hwang, 2003, ASP-DAC '03.

DSP-based statistical self test of on-chip converters

Jacob A. Abraham, Sungbae Hwang, Hak-soo Yu, 2003, Proceedings. 21st VLSI Test Symposium, 2003..

Reuse of addressable system bus for SOC testing

Jacob A. Abraham, Sungbae Hwang, Sungbae Hwang, 2001, Proceedings 14th Annual IEEE International ASIC/SOC Conference (IEEE Cat. No.01TH8558).

Selective-run built-in self-test using an embedded processor

Jacob A. Abraham, Sungbae Hwang, 2002, GLSVLSI '02.

Systems-on-a-chip testing using an embedded microprocessor

Sungbae Hwang, 2002 .

Efficient loop-back testing of on-chip ADCs and DACs

Jeongjin Roh, Sungbae Hwang, Hak-soo Yu, 2003, Proceedings of the ASP-DAC Asia and South Pacific Design Automation Conference, 2003..