H. Watanabe

Precision and robust CMOS voltage reference based on the work function difference of poly Si gate

K. Taniguchi, S. Ando, H. Aota, 2002, Proceedings of the 28th European Solid-State Circuits Conference.

Image sensor with new trench-gated phototransistor

H. Watanabe, K. Yoneda, K. Sakurano, 2017, 2017 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK).