M. Walters

The distribution of radiation‐induced charged defects and neutral electron traps in SiO2, and the threshold voltage shift dependence on oxide thickness

Arnold Reisman, A. Reisman, M. Walters, 1990 .

Radiation‐Induced Neutral Electron Trap Generation in Electrically Biased Insulated Gate Field Effect Transistor Gate Insulators

A. Reisman, A. Reisman, M. Walters, 1991 .