Fei Wang

A silicon cantilever probe card with tip-to-pad electric feed-through and automatic isolation of the metal coating

Songlin Feng, Nanxiang Guo, Yuelin Wang, 2006 .

MEMS Vertical Probe Cards With Ultra Densely Arrayed Metal Probes for Wafer-Level IC Testing

Xinxin Li, Rong Cheng, Fei Wang, 2009, Journal of Microelectromechanical Systems.

A MEMS probe card with 2D dense-arrayed 'hoe'-shaped metal tips

Songlin Feng, Xinxin Li, Fei Wang, 2008 .