M. Varadharajaperumal

3-D simulation of heavy-ion induced charge collection in SiGe HBTs

Alvin J. Joseph, John D. Cressler, Paul W. Marshall, 2003 .

Substrate Engineering Concepts to Mitigate Charge Collection in Deep Trench Isolation Technologies

G. Espinel, G. Vizkelethy, J.P. Comeau, 2006, IEEE Transactions on Nuclear Science.

3-D Simulation of SEU Hardening of SiGe HBTs Using Shared Dummy Collector

Guofu Niu, R. Reed, P. Marshall, 2007, IEEE Transactions on Nuclear Science.

3-D Mixed-Mode Simulation of Single Event Transients in SiGe HBT Emitter Followers and Resultant Hardening Guidelines

Guofu Niu, J.D. Cressler, P.W. Marshall, 2008, IEEE Transactions on Nuclear Science.

Single Event Upset Mechanisms for Low-Energy-Deposition Events in SiGe HBTs

G. Espinel, G. Vizkelethy, J.P. Comeau, 2008, IEEE Transactions on Nuclear Science.

Simulation of a new back junction approach for reducing charge collection in 200 GHz SiGe HBTs

R. Reed, R. Krithivasan, Hua Yang, 2005, IEEE Transactions on Nuclear Science.