D.L. Wollesen

发表

N-Well and p-well performance comparison

D.L. Wollesen, J. Haskell, J. Yu, 1983, 1983 International Electron Devices Meeting.

Accurate models for CMOS scaling and gate delay in deep sub-micron regime

Chenming Hu, Peng Fang, A. Gupta, 1997, SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest.