S. Riepe

Light-Induced Lifetime Degradation in Multicrystalline Silicon

L. J. Geerligs, D. H. Macdonald, S. Riepe, .

Reaching a Kerf Loss Below 100 µm by Optimizing the Relation between Wire Thickness and Abrasive Size for Multi-Wire Sawing

Mahendra Singh, S. Riepe, T. O. Pérez, 2009 .