Min Chen

Compact modeling of stress effects in scaled CMOS

Yu Cao, Chi-Chao Wang, Wei Zhao, 2009, 2009 International Conference on Simulation of Semiconductor Processes and Devices.

nMOS Short Channel Device Characteristics After Soft Oxide Breakdown and Implications for Reliability Projections and Circuits

Yang Yang, Paul E. Nicollian, Vijay K. Reddy, 2014, IEEE Transactions on Electron Devices.

Variability analysis under layout pattern-dependent Rapid-Thermal Annealing process

Min Chen, Yu Cao, Yun Ye, 2009, 2009 46th ACM/IEEE Design Automation Conference.

Modeling of layout-dependent stress effect in CMOS design

Min Chen, Yu Cao, Wei Zhao, 2009, 2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers.

Analysis of pulse signaling for low-power on-chip global bus design

Min Chen, Yu Cao, Yu Cao, 2006, 7th International Symposium on Quality Electronic Design (ISQED'06).