Elviz George

Physics of Failure Based Virtual Testing of Communications Hardware

Michael Osterman, Michael Pecht, Diganta Das, 2009 .

Physics-of-failure (PoF) methodology for electronic reliability

Michael Osterman, Christopher Hendricks, Michael Pecht, 2015 .

Tin whisker analysis of an automotive engine control unit

Michael G. Pecht, Elviz George, 2014, Microelectron. Reliab..

Fusion prognostics-based qualification of microelectronic devices

Michael Pecht, Elviz George, Arvind Vasan, 2014, Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

An evaluation of dwell time and mean cyclic temperature parameters in the Engelmaier model

Michael G. Pecht, Elviz George, Michael D. Osterman, 2015, Microelectron. Reliab..

RoHS compliance in safety and reliability critical electronics

Michael G. Pecht, Elviz George, M. Pecht, 2016, Microelectron. Reliab..

Thermal Cycling Reliability of Alternative Low-Silver Tin-Based Solders

Michael Osterman, Michael Pecht, Elizabeth Benedetto, 2013 .

High lead solder (over 85 %) solder in the electronics industry: RoHS exemptions and alternatives

Michael Osterman, Michael Pecht, Elviz George, 2015, Journal of Materials Science: Materials in Electronics.