S M Nee

Slope distribution of a rough surface measured by transmission scattering and polarization.

L F Johnson, S M Nee, R V Dewees, 2000, Applied optics.

Ellipsometric view on reflection and scattering from optical blacks.

S. Nee, S M Nee, 1992, Applied optics.

Depolarization and principal mueller matrix measured by null ellipsometry.

S. Nee, S M Nee, 2001, Applied optics.

Error analysis of null ellipsometry with depolarization.

S M Nee, 1999, Applied optics.

Depolarization and retardation of a birefringent slab.

S. Nee, S M Nee, 2000, Journal of the Optical Society of America. A, Optics, image science, and vision.

Ellipsometric analysis for surface roughness and texture.

S. Nee, S M Nee, 1988, Applied optics.

Characterization for imperfect polarizers under imperfect conditions.

S. Nee, C. Yoo, T. Cole, 1998, Applied optics.