J. Ogier
发表
D. Goguenheim,
L. Lopez,
M. Carmona,
2014,
2014 29th Symposium on Microelectronics Technology and Devices (SBMicro).
R. Degraeve,
G. Groeseneken,
R. Bellens,
1998
.
G. Molas,
B. De Salvo,
F. Lalande,
2012,
CAS 2012 (International Semiconductor Conference).
D. Goguenheim,
J. Ogier,
C. Bénard,
2008,
2008 IEEE International Integrated Reliability Workshop Final Report.
D. Goguenheim,
J. Ogier,
C. Bénard,
2008,
2008 IEEE International Integrated Reliability Workshop Final Report.
G. Molas,
F. Lalande,
A. Régnier,
2011,
2011 International Semiconductor Device Research Symposium (ISDRS).
D. Goguenheim,
L. Lopez,
O. Gagliano,
2013
.
D. Goguenheim,
J. Ogier,
C. Bénard,
2008,
2008 26th International Conference on Microelectronics.
R. Degraeve,
G. Groeseneken,
R. Bellens,
1996
.
G. Molas,
F. Lalande,
V. Della Marca,
2013,
2013 IEEE International Conference on Solid Dielectrics (ICSD).
G. Molas,
F. Lalande,
L. Lopez,
2011,
CAS 2011 Proceedings (2011 International Semiconductor Conference).
Guido Groeseneken,
Robin Degraeve,
R. Bellens,
1998
.
High Density Embedded PCM Cell in 28nm FDSOI Technology for Automotive Micro-Controller Applications
P. Mattavelli,
P. Cappelletti,
O. Kermarrec,
2020,
2020 IEEE International Electron Devices Meeting (IEDM).
Jean-Luc Ogier,
Didier Goguenheim,
D. Pic,
2008,
Microelectron. Reliab..
R. Degraeve,
G. Groeseneken,
H. Maes,
1996,
ESSDERC '96: Proceedings of the 26th European Solid State Device Research Conference.
Guido Groeseneken,
Robin Degraeve,
Herman Maes,
1996,
Proceedings of International Reliability Physics Symposium.
G. Ghibaudo,
J. Coignus,
D. Roy,
2016,
IEEE Transactions on Device and Materials Reliability.
P. Boivin,
S. Deleonibus,
J. Postel-Pellerin,
2012,
2012 International Semiconductor Conference Dresden-Grenoble (ISCDG).
P. Mattavelli,
R. Ranica,
P. Boivin,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
R. Degraeve,
G. Groeseneken,
R. Degraeve,
1995,
ESSDERC '95: Proceedings of the 25th European Solid State Device Research Conference.
Giulio Torrente,
Jean Coignus,
Alexandre Vernhet,
2017,
Microelectron. Reliab..
G. Gasiot,
P. Roche,
D. Munteanu,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
Romain Laffont,
Jean-Luc Ogier,
Pascal Masson,
2013,
2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC).
Jean-Luc Ogier,
Didier Goguenheim,
Pascal Fornara,
2009,
Microelectron. Reliab..