Sung-Yup Jung

Effect of Cu Migration in a Field Induced Dielectric Failure

Young-Chang Joo, Sang-Soo Hwang, Sung-Yup Jung, 2006 .

The characteristics of Cu-drift induced dielectric breakdown under alternating polarity bias temperature stress

Byoung-Joon Kim, Young-Chang Joo, Seung Jin Yeom, 2009, 2009 IEEE International Reliability Physics Symposium.

The electric field dependence of Cu migration induced dielectric failure in interlayer dielectric for integrated circuits

Young-Chang Joo, Sang-Soo Hwang, Young‐Chang Joo, 2007 .