A. Mocuta
发表
B. Parvais,
A. Vandooren,
J. Ryckaert,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
Diederik Verkest,
Peter Debacker,
Julien Ryckaert,
2019,
Advanced Lithography.
Diederik Verkest,
Peter Debacker,
Julien Ryckaert,
2019,
Advanced Lithography.
P. Wambacq,
A. Mercha,
J. Ryckaert,
2015,
2015 Symposium on VLSI Technology (VLSI Technology).
J. Ryckaert,
P. Weckx,
A. Mocuta,
2018,
2018 IEEE Symposium on VLSI Technology.
M. Angyal,
T. Hook,
A. Steegen,
2007,
2007 IEEE International Electron Devices Meeting.
J. Ryckaert,
D. Verkest,
N. Horiguchi,
2019,
2019 Symposium on VLSI Technology.
W. Dehaene,
B. Kaczer,
P. Weckx,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
P. Eyben,
D. Mocuta,
J. Mitard,
2016,
2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
G. Bouche,
J. Ryckaert,
D. Mocuta,
2018,
2018 IEEE Symposium on VLSI Technology.
J. Ryckaert,
D. Verkest,
P. Weckx,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
Enablement of STT-MRAM as last level cache for the high performance computing domain at the 5nm node
J. Swerts,
A. Spessot,
D. Yakimets,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
J. Ryckaert,
D. Verkest,
P. Raghavan,
2018,
Advanced Lithography.
P. Debacker,
A. Mocuta,
A. Furnemont,
2017,
2017 Symposium on VLSI Technology.
B. Parvais,
D. Verkest,
Y. Sherazi,
2018,
2018 IEEE Symposium on VLSI Technology.
Diederik Verkest,
Peter Debacker,
Julien Ryckaert,
2017,
Advanced Lithography.
B. Kaczer,
G. Hellings,
D. Linten,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
D. Mocuta,
C. Norris,
C. Radens,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
H.-S.P. Wong,
Ying Zhang,
Leathen Shi,
2002,
Digest. International Electron Devices Meeting,.
B. Parvais,
E. Simoen,
G. Hellings,
2018,
2018 IEEE Symposium on VLSI Technology.
A. Mercha,
D. Verkest,
P. Raghavan,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
B. Kaczer,
L. Witters,
N. Collaert,
2016,
2016 IEEE Symposium on VLSI Technology.
B. Kaczer,
P. Weckx,
D. Linten,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
D. Mocuta,
S. Narasimha,
A. Mocuta,
2002,
Digest. International Electron Devices Meeting,.
J.C. Scott,
A. Mocuta,
B. Goplen,
2006,
2009 Symposium on VLSI Technology.
J. Ryckaert,
D. Verkest,
M. Badaroglu,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
S. Narasimha,
A. Mocuta,
K. Rim,
2002,
Digest. International Electron Devices Meeting,.
L. Witters,
N. Collaert,
S. Sioncke,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
A. Mocuta,
B.H. Lee,
T. Kanarsky,
2002,
2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303).
A. Vandooren,
R. Rooyackers,
N. Collaert,
2014,
2014 IEEE International Electron Devices Meeting.
B. Kaczer,
P. Weckx,
P. Raghavan,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
R. Rooyackers,
A. Vais,
D. Lin,
2016,
2016 IEEE Symposium on VLSI Technology.
D. Mocuta,
R. Ritzenthaler,
W. Vandervorst,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
A. Mocuta,
R. Arndt,
A. Ajmera,
2000,
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).