Y. Zhao

Materials Science-based Device Performance Engineering for Metal Gate High-k CMOS

J. Widiez, A. Toriumi, H. Ota, 2007, 2007 IEEE International Electron Devices Meeting.

Modeling of direct tunneling current through interfacial oxide and high-K gate stacks

Marvin H. White, M. White, Yijie Zhao, 2004 .