T. H. Ng

发表

Interfacial and bulk properties of zirconium dioxide as a gate dielectric in metal–insulator–semiconductor structures and current transport mechanisms

Wai Kin Chim, B. H. Koh, Wee Kiong Choi, 2003 .

An integrated (automated) photon emission microscope and MOSFET characterisation system for combined microscopic and macroscopic device analysis

J.C.H. Phang, W. K. Chim, C. L. Lou, 1999, Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394).

Use of Nanoprobing as the Diagnostic Tool for Nanoscaled Devices

Q.F. Wang, P. K. Tan, H. Tan, 2007, 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Theoretical and practical approach to overcome curvature radius limitation of conductive atomic force microscopy tip for imaging of advanced technological node static random access memory devices

P. K. Tan, M. K. Dawood, P. S. Limin, 2014 .

Minimization of germanium penetration, nanocrystal formation, charge storage, and retention in a trilayer memory structure with silicon nitride/hafnium dioxide stack as the tunnel dielectric

W. K. Choi, W. Chim, C. Tung, 2004 .

UV-Raman Microscopy on the Analysis of Ultra-Low-K Dielectric Materials on Patterned Wafers

M. K. Dawood, Z. Mai, J. Lam, 2013 .

Study of Static Noise Margin, Cell Stability and Influence of Electron Beam on Sub-30nm SRAM Using SEM-Based Nanoprobing with 8 Nanoprobes

T. H. Ng, 2012 .

On-chip device and circuit diagnostics on advanced technology nodes by nanoprobing

J. Lam, T. H. Ng, Z. H. Mai, 2014, Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Conductance-voltage measurements on germanium nanocrystal memory structures and effect of gate electric field coupling

W. K. Choi, W. Chim, T. H. Ng, 2006 .

Fabrication and characterization of a trilayer germanium nanocrystal memory device with hafnium dioxide as the tunnel dielectric

B. H. Koh, W. K. Choi, W. Chim, 2004 .

Quantum mechanical modeling of gate capacitance and gate current in tunnel dielectric stack structures for nonvolatile memory application

B. H. Koh, W. K. Choi, W. Chim, 2004 .

Quantum mechanical modeling of capacitance and gate current for MIS structures using zirconium dioxide as the gate dielectric

B. H. Koh, W. Chim, T. H. Ng, 2002, ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. No.02EX575).

Influence of catalytic gold and silver metal nanoparticles on structural, optical, and vibrational properties of silicon nanowires synthesized by metal-assisted chemical etching

M. K. Dawood, H. Tan, S. Tripathy, 2012 .

Evidence of ultra-low-k dielectric material degradation and nanostructure alteration of the Cu/ultra-low-k interconnects in time-dependent dielectric breakdown failure

Fan Zhang, Jeffrey Lam, Zexiang Shen, 2013 .

Zirconium dioxide as a gate dielectric in metal-insulator-silicon structures and current transport mechanisms

B. H. Koh, C. Tung, A. Du, 2002, ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. No.02EX575).

Clarifying the origin of near-infrared electroluminescence peaksfor nanocrystalline germanium in metal-insulator-silicon structures

W. Chim, E. W. H. Kan, T. H. Ng, 2004 .