R. Dasaka

IBM/Macronix PCRAM Joint Project

Matthew J. Breitwisch, Eric A. Joseph, Hsiang-Lan Lung, 2011 .

Precision integrated thickness control with gas cluster ion beam etch

Rich Wise, R. Dasaka, Laertis Economikos, 2014, Advanced Lithography.

Mechanisms of retention loss in Ge2Sb2Te5-based Phase-Change Memory

B. Rajendran, R. Dasaka, Y. Zhu, 2008, 2008 IEEE International Electron Devices Meeting.

Understanding amorphous states of phase-change memory using Frenkel-Poole model

B. Rajendran, R. Dasaka, Y. Zhu, 2009, 2009 IEEE International Electron Devices Meeting (IEDM).

Characterizing the effects of etch-induced material modification on the crystallization properties of nitrogen doped Ge2Sb2Te5

Ying Zhang, Michael A. Paesler, Simone Raoux, 2011 .

Dynamic Resistance—A Metric for Variability Characterization of Phase-Change Memory

B. Rajendran, R. Dasaka, M. Breitwisch, 2009, IEEE Electron Device Letters.

Patterning of N:Ge2Sb2Te5 Films and the Characterization of Etch Induced Modification for Non-Volatile Phase Change Memory Applications

R. Bergmann, R. Dasaka, C.-F. Chen, 2008, 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).

A low power phase change memory using thermally confined TaN/TiN bottom electrode

R. Dasaka, S. Kim, Y. Zhu, 2011, 2011 International Electron Devices Meeting.