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Temperature-dependent x-ray photoemission studies of metastable Co/polyimide interface formation

Harry M. Meyer, J. H. Weaver, Steven G. Anderson, 1988 .

Quantum topology. IV. Relation between the topological and energetic stabilities of molecular structures

R. Bader, Richard F. W. Bader, Yoram Tal, 1981 .

Reliability and electrical properties of new low dielectric constant interlevel dielectrics for high performance ULSI interconnect

P. K. Vasudev, Thomas E. Seidel, T. Seidel, 1996, Proceedings of International Reliability Physics Symposium.