S.H. Crain

Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators

R. Koga, S.H. Crain, K.B. Crawford, 2000, 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527).

Radiation effects in a fixed-point digital signal processor

S.H. Crain, R. Velazco, M.T. Alvarez, 1999, 1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463).

Comparison of flight and ground data for radiation-induced high current states in the 68302 microprocessor

R. Koga, S.H. Crain, K.B. Crawford, 2000, 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527).