S.D. LaLumondiere

Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators

R. Koga, S.H. Crain, K.B. Crawford, 2000, 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527).

Topology-related upset mechanisms in design hardened storage cells

S.D. LaLumondiere, R. Koga, T. Calin, 1997, RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294).