C. Jund

Carrier concentration and minority carrier lifetime measurement in semiconductor epitaxial layers by the mos capacitance method

R. Poirier, R. Poirier, C. Jund, 1966 .

Two-dimensional distribution of carriers in a semiconductor space charge region with current flow

C. Jund, J. Grosvalet, 1966 .

Influence of illumination on MIS capacitances in the strong inversion region

J. Grosvalet, C. Jund, C. Jund, 1967 .

Experimental study of semiconductor surface conductivity

R. Poirier, R. Poirier, J. Grosvalet, 1966 .