Takezo Mawaki

[Papers] Statistical Analyses of Random Telegraph Noise in Pixel Source Follower with Various Gate Shapes in CMOS Image Sensor

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2018 .

Analysis of Random Telegraph Noise Behaviers of nMOS and pMOS toward Back Bias Voltage Changing

Shinya Ichino, Takezo Mawaki, R. Kuroda, 2017 .

Effect of drain current on appearance probability and amplitude of random telegraph noise in low-noise CMOS image sensors

Rihito Kuroda, Shigetoshi Sugawa, Shunichi Wakashima, 2018 .