I. T. Chong

Experimental investigation and quantitative analysis of resistance variations and control in printed thick film resistors

C. K. Liu, T. W. Law, P. L. Cheng, 2002, 52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345).

Parametric analysis of steam driven delamination in electronics packages

David C C Lam, Pin Tong, P. Tong, 2000 .