G. T. Baumbach

Dislocation strain field in ultrathin bonded silicon wafers studied by grazing incidence x-ray diffraction

Hubert Moriceau, D. Lübbert, Frank Fournel, 2002 .

Grazing incidence diffraction by epitaxial multilayered gratings

Ullrich Pietsch, Anne Talneau, D. Lübbert, 1998 .