Jonathan Pellish

Crosscutting: Internal Payloads Panel Discussion

Jonathan Pellish, 2018 .

Characterizing the Effects of Single Event Upsets on Synchronous Data Paths

Jonathan Pellish, Hak Kim, Melanie Berg, 2013, IEEE Transactions on Nuclear Science.

Commercial Off-The-Shelf (COTS) Electronics Reliability for Space Applications

Jonathan Pellish, J. Pellish, 2018 .

The effects of heavy ion radiation on digital micromirror device performance

Dmitry Vorobiev, Zoran Ninkov, Anton Travinsky, 2016, SPIE OPTO.

Radiation Performance of Commercial SiGe HBT BiCMOS High Speed Operational Amplifiers

Jonathan Pellish, Dakai Chen, Sam Burns, 2010, 2010 IEEE Radiation Effects Data Workshop.

Single-Event and Total Dose Testing for Advanced Electronics

Jonathan Pellish, J. Pellish, 2012 .