G. H. Buh

Atomic force microscope laser illumination effects on a sample and its application for transient spectroscopy

Joseph J. Kopanski, J. Kopanski, G. Buh, 2003 .

Imaging of a silicon pn junction under applied bias with scanning capacitance microscopy and Kelvin probe force microscopy

Young Kuk, Chohui Kim, Y. Kuk, 2000 .

Real-time evolution of trapped charge in a SiO2 layer: An electrostatic force microscopy study

Hayoung Chung, Y. Kuk, Y. Kuk, 2001 .