D. Panchagade

High Speed Digital Image Correlation for Transient-Shock Reliability of Electronics

P. Lall, D. Iyengar, S. Shantaram, 2007, IEEE Transactions on Components and Packaging Technologies.

Design Envelopes and Optical Feature Extraction Techniques for Survivability of SnAg Lead-free Packaging Architectures Under Shock and Vibration

P. Lall, D. Iyengar, S. Shantaram, 2008, IEEE Transactions on Electronics Packaging Manufacturing.

Time-frequency and auto-regressive techniques for prognostication of shock-impact reliability of implantable biological electronic systems

P. Lall, P. Gupta, P. Lall, 2008, 2008 58th Electronic Components and Technology Conference.