Dooyoung Kim

发表

Cost-efficient Chip Identification Method using Scan Flip-flop based Physically Unclonable Function

Jihun Jung, Sungju Park, Jinuk Kim, 2018 .

Self-Configuration of Neighbor Cell List Utilizing E-UTRAN NodeB Scanning in LTE Systems

Jaechan Lim, Daehyoung Hong, Bongjhin Shin, 2010, 2010 7th IEEE Consumer Communications and Networking Conference.

Design of Defect Diagnosis Platform based on CAN Network for Reliability Improvement of Vehicle SoC

Sungju Park, Dooyoung Kim, Doyeon Hwang, 2015 .

CAN-Based Aging Monitoring Technique for Automotive ASICs With Efficient Soft Error Resilience

Sungju Park, Jinuk Kim, Dooyoung Kim, 2020, IEEE Access.

Time-multiplexed test access architecture for stacked integrated circuits

Jihun Jung, Sungju Park, Muhammad Adil Ansari, 2016, IEICE Electron. Express.

Scan-Puf: Puf Elements Selection Methods for Viable IC Identification

Jihun Jung, Sungju Park, Muhammad Adil Ansari, 2015, 2015 IEEE 24th Asian Test Symposium (ATS).

Reduced Pin Count Test Techniques using IEEE Std. 1149.7

Sungju Park, Dooyoung Kim, Myunghoon Lim, 2013 .

Active and Dynamic Approaches for Clustering Time Dependent Information: Lag Target Time Series Clustering and Multi-Factor Time Series Clustering

Chris P. Tsokos, Dooyoung Kim, 2018, J. Stat. Theory Appl..

Design Reuse of on/off-Chip Bus Bridge for Efficient Test Access to AMBA-based SoC

Jaehoon Song, Sungju Park, Hyunbean Yi, 2007, 16th Asian Test Symposium (ATS 2007).

Low Power Scan Chain Reordering Method with Limited Routing Congestion for Code-based Test Data Compression

Sungju Park, Jihun Jung, Dooyoung Kim, 2016 .

Efficient Pre-Bond Testing of TSV Defects Based on IEEE std. 1500 Wrapper Cells

Jihun Jung, Sungju Park, Muhammad Adil Ansari, 2016 .

EPS용 IPMSM의 토크리플 저감 최적설계

홍정표, Jung-Pyo Hong, 손형수, 2015 .

An Efficient Technique to Improve Compression for Low-Power Scan Test Data

Sungju Park, Jaehoon Song, Ki Tae Kim, 2006 .

Test access mechanism for automotive chips through vehicular control networks

Jihun Jung, Sungju Park, Muhammad Adil Ansari, 2016, 2016 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia).

Efficient diagnosis technique for aging defects on automotive semiconductor chips

Jihun Jung, Sungju Park, Muhammad Adil Ansari, 2015, 2015 20th IEEE European Test Symposium (ETS).

Multi-hop transmission and routing with hierarchical modulation

Chong-kwon Kim, Dooyoung Kim, Taemin Park, 2012, EURASIP J. Wirel. Commun. Netw..

Hybrid Test Data Transportation Scheme for Advanced NoC-Based SoCs

Sungju Park, Jihun Jung, Dooyoung Kim, 2015 .

Erratum to "Time-Multiplexed-Network for Test Cost Reduction"

Jihun Jung, Sungju Park, Muhammad Adil Ansari, 2018, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Delay Fault Test for Interconnection on Boards and SoCs

Sungju Park, Hyunbean Yi, Dooyoung Kim, 2007 .

Efficient Parallel Scan Test Technique for Cores on AMBA-based SoC

Sungju Park, Jihun Jung, Jaehoon Song, 2014 .

Orienteering Problem with Unknown Stochastic Reward to Informative Path Planning for Persistent Monitoring and Its Solution

Dooyoung Kim, 2019 .

Efficient Low-power Scan Test Method based on Exclusive Scan and Scan Chain Reordering

Sungju Park, Jinuk Kim, Dooyoung Kim, 2020 .

Use of Deep Learning for Position Estimation and Control of Soft Glove

Sungho Jo, Dooyoung Kim, Jeesoo Ha, 2018, 2018 18th International Conference on Control, Automation and Systems (ICCAS).

FDR Test Compression Algorithm based on Frequency-ordered

Sungju Park, Dooyoung Kim, Changmin Mun, 2014 .