Paul E. West

Core monitors: monitoring performance in multicore processors

Sally A. McKee, Yuval Peress, Gary S. Tyson, 2009, CF '09.

Program Differentiation

Gary S. Tyson, Stephen Roderick Hines, David B. Whalley, 2012, J. Circuits Syst. Comput..

Silicon single atom steps as AFM height standards

Ndubuisi G. Orji, Ronald G. Dixson, Raghu Kacker, 2001, SPIE Advanced Lithography.

Next generation performance monitoring

Paul E. West, 2010 .

Applications of STM Technologies

Paul E. West, Sheila Henely, 1989, Advanced Lithography.

A comparison of atomic force microscopy (AFM) and dynamic light scattering (DLS) methods to characterize nanoparticle size distributions

Paul E. West, P. West, M. Mecartney, 2008 .