Jurriaan M. Zwier

Absolute and relative quantification and calibration for sectioning fluorescence microscopy using standardized uniform fluorescent layers and SIPchart-based correction procedures

Kees Jalink, G. J. Brakenhoff, Jurriaan M. Zwier, 2007, SPIE BiOS.

SIPcharts using uniform ultra-thin and thin layers for Z-response measurements in two-photon excitation fluorescence microscopy

Francesca Cella, Alberto Diaspro, Giuseppe Vicidomini, 2007, SPIE BiOS.