Peter Zeppenfeld

发表

Defining and Analysing the Optical Properties of Materials at the Nanoscale: A Collection of Thoughts, Opinions, Ideas and Data that Have Matured Over Years on Exploiting Ellipsometry for a Range of Characterisation Needs

Tatiana Novikova, Herbert Wormeester, Maria Losurdo, 2010 .

Image Processing Method Based on Hybrid Programming of IDL and LabVIEW

Peter Zeppenfeld, 2012 .

Fluorescence study of silicon fabricated by nanosecond pulse laser

Xing Fu, Chunyang Liu, Yulan Lu, 2010, Photonics North.

Methane mobility in carbon nanotubes

Peter Zeppenfeld, B. Asmussen, Mark R. Johnson, 2000 .