S. A. Little

Defining and Analysing the Optical Properties of Materials at the Nanoscale: A Collection of Thoughts, Opinions, Ideas and Data that Have Matured Over Years on Exploiting Ellipsometry for a Range of Characterisation Needs

Tatiana Novikova, Herbert Wormeester, Maria Losurdo, 2010 .

Optical detection of melting point depression for silver nanoparticles via in situ real time spectroscopic ellipsometry

S. A. Little, Sylvain Marsillac, Robert W. Collins, 2012 .