Patrick Girard
发表
Arnaud Virazel,
Alberto Bosio,
Luigi Dilillo,
2014,
17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems.
Zhili Chen,
Tianming Ni,
Zhengfeng Huang,
2020,
IEEE Transactions on Computers.
Alberto Bosio,
Mario Barbareschi,
Patrick Girard,
2020,
Proceedings of the IEEE.
V. Gherman,
Patrick Girard,
Arnaud Virazel,
2020,
J. Electron. Test..
João Paulo Teixeira,
Serge Pravossoudovitch,
Christian Landrault,
1999,
ISCAS'99. Proceedings of the 1999 IEEE International Symposium on Circuits and Systems VLSI (Cat. No.99CH36349).
Arnaud Virazel,
Alberto Bosio,
Luigi Dilillo,
2013,
2013 18th IEEE European Test Symposium (ETS).
Patrick Girard,
P. Girard,
2019,
Outstanding Contributions to Logic.
Huaguo Liang,
Zhengfeng Huang,
Xiaoqing Wen,
2020,
ISCAS.
Mark Mohammad Tehranipoor,
Seiji Kajihara,
Laung-Terng Wang,
2013,
2013 22nd Asian Test Symposium.
Arnaud Virazel,
Alberto Bosio,
Matteo Sonza Reorda,
2016,
2016 21th IEEE European Test Symposium (ETS).
Luigi Dilillo,
Aida Todri,
Alberto Bosio,
2012,
2012 Design, Automation & Test in Europe Conference & Exhibition (DATE).
Arnaud Virazel,
Alberto Bosio,
Luigi Dilillo,
2012,
2012 17th IEEE European Test Symposium (ETS).
Bruno Rouzeyre,
Vincent Kerzèrho,
Emanuele Valea,
2020,
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS).
Benoit Boulet,
Vincent Thomson,
Patrick Girard,
2006,
Int. J. Manuf. Res..
Arnaud Virazel,
Alberto Bosio,
Luigi Dilillo,
2014,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Luigi Dilillo,
Bashir M. Al-Hashimi,
Patrick Girard,
2006,
Proceedings of the Design Automation & Test in Europe Conference.
Arnaud Virazel,
Alberto Bosio,
Luigi Dilillo,
2014,
2014 IEEE 23rd North Atlantic Test Workshop.
Patrick Girard,
Ambika Prasad Shah,
2020,
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS).