F. Anstotz

Development of a 3D dynamic measurement system using a high speed camera with white light scanning interference microscopy associated with real-time FPGA image processing

Renaud Kiefer, Paul Montgomery, Gyasi Johnson, 2007, SPIE Optical Metrology.

A mixed-signal ASIC in CMOS technology for industrial AC current sensing with galvanic isolation

P. Poure, F. Anstotz, L. Hebrard, 2002, Industrial Electronics, 2002. ISIE 2002. Proceedings of the 2002 IEEE International Symposium on.

Chapter 11 Real-Time and High-Quality Online 4D FF-OCT Using Continuous Fringe Scanning with a High-Speed Camera and FPGA Image Processing

Fabien Salzenstein, Paul Montgomery, F. Anstotz, 2016 .

Detection of defects in a transparent polymer with high resolution tomography using white light scanning interferometry and noise reduction

P. C. Montgomery, A. Leong-Hoï, B. Serio, 2015, Optical Metrology.

High-resolution full-field optical coherence tomography using high dynamic range image processing

P. C. Montgomery, A. Leong-Hoï, B. Serio, 2016, SPIE Photonics Europe.

High-speed, on-line 4D microscopy using continuously scanning white light interferometry with a high-speed camera and real-time FPGA image processing

F. Anstotz, Paul Montgomery, J. Montagna, 2011, Optical Metrology.